11-15
V. Vonk,
Surface
structure refinement including anomalous crystal truncation rods,
J. Appl. Cryst. 44 (2011)
1217-1221
Abstract
A surface
structure refinement procedure is introduced, which uses both anomalous and non-anomalous
crystal truncation rod data simultaneously. It is shown how a single structural
model can be refined against data sets measured at different wavelengths and
how this can greatly reduce correlations between fit parameters. The structure
factors are computed taking into account the anomalous dispersion corrections
and are scaled to the data, whereby each data set is assigned its own scale
factor. The procedure is implemented in the widely used surface diffraction
program ROD. The structure of a one unit cell thin LaAlO(3)
film on an SrTiO(3)(001) substrate is refined by
making use of a non-anomalous data set and one taken at the La L(1)-edge.