Morphology of and discolation movement in n-C40H82 paraffin crystals grown from solution,
M. Plomp, W.J.P. van Enckevort, P.J.C.M. van Hoof, C.J. van de Streek,
J. of Cryst.Growth 249 (2003) 600-613

Abstract
Ex situ atomic force microscopy, supplemented with in situ optical microscopy, was applied to the {0 0 1} surface of n-C40H82 paraffin crystals grown from n-hexane solution. Platelets of monomolecular thickness, small ultra-thin crystals originating from one or two growth spiral(s), as well as aggregates of thicker crystals were found. The monomolecular plates are the actual growth form of perfect n-paraffin crystals, the growth of which is determined by one- and two-dimensional nucleation. Owing to post-growth stresses acting on the thin crystals slip movement by screw dislocations occurred, which is visible as crossing of as-grown and post-growth steps on the crystal surface. The shear stresses for dislocation movement result from adhesion forces acting on the crystals after evaporation of the liquid.